Demonstration of Highly Manufacturable STT-MRAM Embedded in 28nm Logic
已完结10由 bit5i54 发布于 2024/11/7 8:50:45
DOI:10.1109/IEDM.2018.8614635
作者:Y. Song, J. Lee, Sung-hee Han, H. Shin, K. H. Lee, K. Suh, D. Jeong, G. Koh, Sechung Oh, Joon-Min Park, Soojeoung Park, B. Bae, O. I. Kwon, K. Hwang, Bum-seok Seo, You Kyoung Lee, S. Hwang, Dongsoo Le
文献类型:期刊论文
补充材料:只需要正文
文献链接:https://doi.org/10.1109/IEDM.2018.8614635
Institute of Electrical and Electronics Engineers (IEEE)