DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited)
已完结10由 少年游 发布于 2025/12/16 10:24:57
DOI:10.1109/IRPS48227.2022.9764539
作者:S. Ganguly, K. Bothe, Alex Niyonzima, T. Smith, Yueying Liu, J. Fisher, F. Radulescu, D. Gajewski, S. Sheppard, J. Milligan, Basim Noori, J. Palmour
文献类型:期刊论文
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Institute of Electrical and Electronics Engineers (IEEE)