Efficiency improvement of TOPCon half-cells and modules via laser-assisted edge isolation (LAEI) technology

已完结 10 由回眸驻守发布于 2026/3/19 8:40:23

DOI:10.1016/j.cej.2026.175136
作者：Xukai Zhao ,?Zunke Liu ,?Biao Wu ,?Yi Liu ,?Xiaowei Liu ,?Hongping Jiang ,?Chaoyan Fang ,?Chen Lv ,?Yikun Liu ,?Shihua Chen ,?Wenli Yan ,?Wei Liu ,?Zhenhai Yang ,?Deshuang Chen ,?Yong Ren ,?Xiulin Jia
文献类型：期刊论文
补充材料：只需要正文

Elsevier

Abstract：This study proposes a laser-assisted edge isolation (LAEI) technology for enhancing the efficiency of tunnel oxide passivated contact (TOPCon) half-cells. The pn-junction along the pre-scrib

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