Characterization of polyamide thin films by atomic force microscopy
待确认10由 HC Pei 发布于 2026/11/7 14:38:17
DOI:10.1016/j.polymer.2024.127350
作者:Olivia M. McIntee ,?Nurshaun Sreedhar ,?Brian C. Welch ,?Victor M. Bright ,?Abhishek Roy ,?Mou Paul ,?Alan R. Greenberg
文献类型:期刊论文
补充材料:只需要正文