2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

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2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - 最新文献

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Advanced scan chain failure analysis using laser modulation mapping and continuous wave probing

Pub Date : 2012-07-02 DOI: 10.1109/IPFA.2012.6306326 S. Kasapi, W. Lo, J. Liao, B. Cory, H. Marks

Failure Analysis of damaged dielectric on resistor and capacitor with EMMI and IR-OBIRCH

Pub Date : 2012-07-02 DOI: 10.1109/IPFA.2012.6306276 Li Tian, Miao Wu, Diwei Fan, Chunlei Wu, Gaojie Wen, Dong Wang

Improving yield learning by rapid electrical fault inspection and localization

Pub Date : 2012-07-02 DOI: 10.1109/IPFA.2012.6306319 Beomjun Kim, Jongtaek Hong, Yongwoon Han, I. Kapilevich, J. Block, T. Lundquist, Myung Hwan Kim

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