A Novel High performance D-latch using Gate Engineered Schottky device

Mehak Ashraf Mir, S. Loan
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Abstract

In this paper, we propose and simulate a novel D latch design employing a metal silicide source/drain Schottky structure based Sajad Sunil Schottky (SSS) device. The technology is utilised in the realisation of D latch using split gate technique. Conventional D-latch employs at least 4 NAND gates i.e. 16 MOS transistors for its CMOS implementation which therefore calls for more area as well as consumes more power. The novelty of our design is that it reduces the transistor count that is as low as 3 and thereby enhances the packaging density along with retaining all the benefits of the parent device like elimination of series resistance problem, Low power dissipation, reduced number of junctions and reduction in thermal budget due to inclusion of metal source/drain.
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一种采用门控肖特基器件的新型高性能d型锁存器
在本文中,我们提出并模拟了一种基于Sajad - Sunil Schottky (SSS)器件的新型D锁存器设计,该设计采用金属硅化物源/漏Schottky结构。该技术应用于分闸技术实现D锁存器。传统的d锁存器采用至少4个NAND门,即16个MOS晶体管用于其CMOS实现,因此需要更多的面积以及消耗更多的功率。我们设计的新颖之处在于,它减少了晶体管数量,低至3个,从而提高了封装密度,同时保留了母器件的所有优点,如消除串联电阻问题,低功耗,减少结数以及由于包含金属源/漏而减少的热预算。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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