P. Yudin, M. Nikol’ski, O. Vendik, S. Zubko, I. Vendik
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引用次数: 0
Abstract
A procedure of extracting model parametrs of a ferroelectric thin film from the experimental characteristics of the capacitance and the loss tangent of a planar capacitor is proposed. It is based on a correct phenomenological model of the capacitance and the loss tangent of the planar capacitor containing the ferroelectric thin film. The calculation of the model parameters was realized by Monte Carlo method based on properties of the quasi-random sequences. The software allows calculating capacitance and loss tangent of the planar capacitor as a function of temperature and biasing field. The model is used for a development of a CAD tool intended for a design of tunable microwave devices based on ferroelectric films.
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