首页 > 期刊列表> 2003 Design, Automation and Test in Europe Conference and Exhibition
paperpass

2003 Design, Automation and Test in Europe Conference and Exhibition

浏览量2797
分享 分享
微信好友 朋友圈 QQ好友 复制链接
订阅订阅 查看最新文献查看最新文献
同类期刊
2003 Design, Automation and Test in Europe Conference and Exhibition

发文信息

同类期刊

Hans Journal of Nanotechnology
Hans Journal of Nanotechnology
Men and the Making of Modern British Feminism
Men and the Making of Modern British Feminism
Today and Tomorrow of Russian Economy
Today and Tomorrow of Russian Economy
Developments in Veterinary Virology
Developments in Veterinary Virology
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395)
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395)
Social Media and Journalism - Trends, Connections, Implications
Social Media and Journalism - Trends, Connections, Implications

2003 Design, Automation and Test in Europe Conference and Exhibition - 最新文献

查看全部

Interconnect planning with local area constrained retiming [logic IC layout]

Pub Date : 2003-12-19 DOI: 10.1109/DATE.2003.1253649 Ruibing Lu, Cheng-Kok Koh

Reconfigurable signal processing in wireless terminals [mobile applications]

Pub Date : 2003-12-19 DOI: 10.1109/DATE.2003.1253836 J. Helmschmidt, E. Schuler, P. Rao, S. Rossi, S. Di Matteo, R. Bonitz

On-chip stochastic communication [SoC applications]

Pub Date : 2003-12-19 DOI: 10.1109/DATE.2003.1253703 T. Dumitras, R. Marculescu
免责声明:
本页显示期刊或杂志信息,仅供参考学习,不是任何期刊杂志官网,不涉及出版事务,特此申明。如需出版一切事务需要用户自己向出版商联系核实。若本页展示内容有任何问题,请联系我们,邮箱:info@booksci.cn,我们会认真核实处理。
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1