{"title":"The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study","authors":"M. Worsman, M. Wong, Yim-Shu Lee","doi":"10.1109/ETW.2001.946666","DOIUrl":null,"url":null,"abstract":"Equivalence amongst the single and double catastrophic component faults of a potentiometric DAC under steadystate dc conditions is investigated. Easily identifiable equivalent faults are shown to populate the fault list in significant numbers. By facilitating a systematic testdesign approach focused on the prevention of equivalent fault conditions during test, equivalent fault analysis is used to greatly increase the percentage of catastrophic component faults diagnosable with a Built-In Self-Test (BIST) in [M.S. Nejad, L. Sebaa, A. Ladick, and H. Kuo, \"Analog Built-In Self-Test,\" Proc. IEEE Int'l ASIC Conf and Exh., pp. 407-411, 1994]. The efect on analysis of component tolerances and other nonidealities is yet to be considered.","PeriodicalId":339694,"journal":{"name":"IEEE European Test Workshop, 2001.","volume":"3 7","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE European Test Workshop, 2001.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETW.2001.946666","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Equivalence amongst the single and double catastrophic component faults of a potentiometric DAC under steadystate dc conditions is investigated. Easily identifiable equivalent faults are shown to populate the fault list in significant numbers. By facilitating a systematic testdesign approach focused on the prevention of equivalent fault conditions during test, equivalent fault analysis is used to greatly increase the percentage of catastrophic component faults diagnosable with a Built-In Self-Test (BIST) in [M.S. Nejad, L. Sebaa, A. Ladick, and H. Kuo, "Analog Built-In Self-Test," Proc. IEEE Int'l ASIC Conf and Exh., pp. 407-411, 1994]. The efect on analysis of component tolerances and other nonidealities is yet to be considered.
研究稳态直流条件下电位式DAC的单、双突变分量故障的等效性。显示容易识别的等效故障，以大量填充故障列表。通过促进系统的测试设计方法，重点是在测试过程中预防等效故障条件，等效故障分析用于极大地增加灾难性组件故障的百分比，可通过内置自检(BIST)诊断Nejad, L. Sebaa, A. Ladick，和H. Kuo，“模拟内置自测试”，IEEE国际ASIC会议和Exh。[j]。对分析部件公差和其他非理想性的影响还有待考虑。
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