Hysteresis Transformation and Memristor Design Framework for Two-Dimensional Materials for Neuromorphic Computing:Physics-Based Charge-Diffusion Modelling and Machine Learning

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2026-10-13 Epub Date: 2026-09-23 DOI:10.1021/acsaelm.6c01818
Shilpa Chauhan, Davinder Kaur, Ankush Kumar
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Abstract

Hysteresis is the defining electrical signature of memristive dynamics and underpins the history-dependent conductance required for artificial synapses and neuromorphic computing. However, unlike conventional passive electronic components, memristive devices lack a universally accepted framework for quantitatively characterizing and reporting their diverse hysteretic responses, making cross-device comparison and systematic engineering difficult. For lateral 2D-material memristors, this challenge is amplified by the strong dependence of hysteresis on coupled material, transport, and interface parameters, yet a unified quantitative map connecting these parameters to hysteresis emergence, loop classes, figures of merit (FoMs), and controllable transformations between hysteresis types remains unavailable. In this work, we develop a physics-informed, data-driven hysteresis engineering framework for 2D lateral memristors using a coupled transport model that solves the drift–diffusion equations for the quasi-Fermi potentials of charge carriers, the electrostatic potential from Poisson’s equation, and Schottky barrier modulation at a specified temperature. From ∼10,000 simulations across seven input parameters, we identified that ∼13.3% of configurations exhibit hysteresis, clustering into six loop types. We define 11 FoMs (loop area, memory ratios, nonlinearity, collapse/stationary indicators) and map their type-specific statistical distributions. Sensitivity and correlation analyses identify dominant knobs and enable loop transformations by tuning electrode spacing, vacancy mobility, barrier height, and scan rate, in agreement with experimental reports. We establish more than 500 relationships between input material/device properties and output hysteresis FoMs. Machine-learning models achieve 96.5% accuracy in hysteresis prediction and 76.38% accuracy in hysteresis loop-type classification. This work provides a framework for hysteresis engineering in memristive devices, enabling rapid screening and inverse design for next-generation computing applications.

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用于神经形态计算的二维材料的迟滞变换和忆阻器设计框架:基于物理的电荷扩散建模和机器学习
迟滞是记忆动力学的定义电特征,是人工突触和神经形态计算所需的历史依赖电导的基础。然而,与传统的无源电子元件不同,忆阻器件缺乏一个普遍接受的框架来定量表征和报告其不同的滞后响应,这使得跨器件比较和系统工程变得困难。对于横向2d材料忆阻器,由于迟滞对耦合材料、输移和界面参数的强烈依赖,这一挑战被放大了,然而,将这些参数与迟滞出现、回路类别、优值图(FoMs)和迟滞类型之间的可控转换联系起来的统一定量图仍然不可用。在这项工作中,我们开发了一个物理信息,数据驱动的二维横向记忆电阻器的滞后工程框架,使用耦合输运模型,解决了电荷载流子的准费米势的漂移扩散方程,泊松方程中的静电势,以及特定温度下的肖特基势垒调制。从跨7个输入参数的~ 10,000次模拟中,我们发现~ 13.3%的配置表现出滞后,聚类为6种环路类型。我们定义了11个fms(环路面积、记忆比、非线性、崩溃/平稳指标),并绘制了它们特定类型的统计分布。灵敏度和相关性分析确定了主导旋钮,并通过调整电极间距,空位迁移率,势垒高度和扫描率来实现环路转换,与实验报告一致。我们在输入材料/器件属性和输出迟滞FoMs之间建立了500多种关系。机器学习模型在迟滞预测上的准确率为96.5%,在迟滞环类型分类上的准确率为76.38%。这项工作为忆阻器件的迟滞工程提供了一个框架,使下一代计算应用的快速筛选和逆向设计成为可能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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