Pub Date : 2011-10-24DOI: 10.1109/AUTEST.2011.6058734
T. Jamison, D. Lowenstein
With the aggressive schedule, in which the Department of Defense is moving away from GFE (Government Furnished Equipment) on new contracts, the Aerospace industry is in the need to find a new way to acquire test and measurement assets with a new eye on financial efficiency and effectiveness. This new way of doing business will drive companies to change the way they specify, acquire and dispose of test equipment and more importantly how they manage the overall cost envelope of those assets. Although commercial companies have always done business this way, not all the same strategies will work for the Aerospace industry because of their unique attributes of program development, production and support. This paper will explore a strategy of combining commercial best practices with industry specific needs. Specifically, it will combine the notion of developing a portfolio of financial equipment acquisition options (rent, lease, buy) with specific PLC (Product Life Cycle) needs and program business essentials of the defense industry.
{"title":"21st century strategies for minimizing cost of test ownership while maximizing availability and technology refresh for test and measurement assets","authors":"T. Jamison, D. Lowenstein","doi":"10.1109/AUTEST.2011.6058734","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058734","url":null,"abstract":"With the aggressive schedule, in which the Department of Defense is moving away from GFE (Government Furnished Equipment) on new contracts, the Aerospace industry is in the need to find a new way to acquire test and measurement assets with a new eye on financial efficiency and effectiveness. This new way of doing business will drive companies to change the way they specify, acquire and dispose of test equipment and more importantly how they manage the overall cost envelope of those assets. Although commercial companies have always done business this way, not all the same strategies will work for the Aerospace industry because of their unique attributes of program development, production and support. This paper will explore a strategy of combining commercial best practices with industry specific needs. Specifically, it will combine the notion of developing a portfolio of financial equipment acquisition options (rent, lease, buy) with specific PLC (Product Life Cycle) needs and program business essentials of the defense industry.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"10 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117297362","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-24DOI: 10.1109/AUTEST.2011.6058769
Hien D. Nguyen, I. A. Miller
In today's environment, building a reliable and cost-effective spacecraft is perhaps emphasized more than ever before. Sponsors are looking for the same high-quality products but at lower costs and with shorter schedules. Whether it is a spacecraft for the Department of Defense (DoD), a research observatory for the National Aeronautics and Space Administration (NASA), or a commercial communications satellite, total cost is a significant factor.
{"title":"Cost impact of automated acceptance testing of Electrical Ground Support Equipment for spacecraft testing","authors":"Hien D. Nguyen, I. A. Miller","doi":"10.1109/AUTEST.2011.6058769","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058769","url":null,"abstract":"In today's environment, building a reliable and cost-effective spacecraft is perhaps emphasized more than ever before. Sponsors are looking for the same high-quality products but at lower costs and with shorter schedules. Whether it is a spacecraft for the Department of Defense (DoD), a research observatory for the National Aeronautics and Space Administration (NASA), or a commercial communications satellite, total cost is a significant factor.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122094031","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-24DOI: 10.1109/MIM.2012.6263977
K. Paton
Unlike signal switching, power switches have significant minimum operational requirements for both voltage and current. These minimum requirements affect usage in test programs and self test approaches. This paper will discuss the considerations necessary when testing power switches or when using power switching in test programs. In addition, techniques will be described which can reduce or remove build up of deposits, improving switch operation.
{"title":"The test, usage and maintenance of power switching subsystems","authors":"K. Paton","doi":"10.1109/MIM.2012.6263977","DOIUrl":"https://doi.org/10.1109/MIM.2012.6263977","url":null,"abstract":"Unlike signal switching, power switches have significant minimum operational requirements for both voltage and current. These minimum requirements affect usage in test programs and self test approaches. This paper will discuss the considerations necessary when testing power switches or when using power switching in test programs. In addition, techniques will be described which can reduce or remove build up of deposits, improving switch operation.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126522903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-24DOI: 10.1109/AUTEST.2011.6058727
Abhjit Bhoite, N. Beke, Timothy Duffy, M. Moore, M. Torres
The rapid deployment of fiber optic technology in military, avionic, and consumer platforms is driving the need for improvement in fiber optic cable field maintenance, specifically a reduction in operator inspection complexity and ambiguity. Current inspection technology depends on operator experience with various inspection standards and is further complicated in military field deployments where bench top capable inspection equipment does not lend itself to field installations. Military fiber endface inspection is currently very expertise driven and time consuming for avionic environments. Thus there is a need for automated, portable fiber optic inspection technology that is suitable for all skill levels, and is capable of field deployment and maintenance. This paper explores the issue of current fiber optic field inspection technology and present an automated test inspection set to address these problems.
{"title":"Automated fiber optic cable endface field inspection technology","authors":"Abhjit Bhoite, N. Beke, Timothy Duffy, M. Moore, M. Torres","doi":"10.1109/AUTEST.2011.6058727","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058727","url":null,"abstract":"The rapid deployment of fiber optic technology in military, avionic, and consumer platforms is driving the need for improvement in fiber optic cable field maintenance, specifically a reduction in operator inspection complexity and ambiguity. Current inspection technology depends on operator experience with various inspection standards and is further complicated in military field deployments where bench top capable inspection equipment does not lend itself to field installations. Military fiber endface inspection is currently very expertise driven and time consuming for avionic environments. Thus there is a need for automated, portable fiber optic inspection technology that is suitable for all skill levels, and is capable of field deployment and maintenance. This paper explores the issue of current fiber optic field inspection technology and present an automated test inspection set to address these problems.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133788247","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-24DOI: 10.1109/AUTEST.2011.6058733
Raymond White, Brian Richardson
Electronic assemblies that fail on an aircraft often will not fail on a laboratory tester or will exhibit random and hard to pinpoint failures. This is a discussion of environmental testing types, why environmental testing is needed, and a brief review of several such assemblies and test systems and what extra environmental testing was performed to identify issues that were not identifiable under normal testing.
{"title":"Anecdotal experiences on the value of limited environmental testing for the analysis of “No Fault Found” assemblies","authors":"Raymond White, Brian Richardson","doi":"10.1109/AUTEST.2011.6058733","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058733","url":null,"abstract":"Electronic assemblies that fail on an aircraft often will not fail on a laboratory tester or will exhibit random and hard to pinpoint failures. This is a discussion of environmental testing types, why environmental testing is needed, and a brief review of several such assemblies and test systems and what extra environmental testing was performed to identify issues that were not identifiable under normal testing.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133422400","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-24DOI: 10.1109/AUTEST.2011.6058745
M. Schuh, J. Sheppard, S. Strasser, R. Angryk, C. Izurieta
We created an application that facilitates improved knowledge discovery from aircraft maintenance data by transforming transactional database records into ontology-based event graphs, and then providing a filterable visualization of event sequences through time. We developed OWL ontologies based on formally defined IEEE standards, and use these ontologies to guide the data mining and data transformation processes. Our application removes much of the users burden for data look-up and greatly increases the potential for knowledge discovery from data (KDD) in this field. We provide an easy-to-use interface that generates relevant sequences of data in a meaningful context in a fraction of the time it would take domain experts to retrieve and display similar information.
{"title":"Ontology-guided knowledge discovery of event sequences in maintenance data","authors":"M. Schuh, J. Sheppard, S. Strasser, R. Angryk, C. Izurieta","doi":"10.1109/AUTEST.2011.6058745","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058745","url":null,"abstract":"We created an application that facilitates improved knowledge discovery from aircraft maintenance data by transforming transactional database records into ontology-based event graphs, and then providing a filterable visualization of event sequences through time. We developed OWL ontologies based on formally defined IEEE standards, and use these ontologies to guide the data mining and data transformation processes. Our application removes much of the users burden for data look-up and greatly increases the potential for knowledge discovery from data (KDD) in this field. We provide an easy-to-use interface that generates relevant sequences of data in a meaningful context in a fraction of the time it would take domain experts to retrieve and display similar information.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133556863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-24DOI: 10.1109/AUTEST.2011.6058788
Ron Taylor
This paper examines the IEEE Automatic Test Markup Language (ATML) family of standards and some of the impediments which must be overcome to successfully implement these standards. The paper specifically focuses on how software tools can help alleviate these issues and increase the benefits of using these new standards in Automatic Test System (ATS) related applications. The ATML standards provide a common exchange format for test data adhering to the Extensible Markup Language (XML) standard. ATML promises to provide interoperability between tools and multiple test platforms through the standardization of common test related data. The ATML standards have now been published through the IEEE Standards Coordinating Committee 20 (SCC20) committee and are beginning to exhibit considerable interest in the ATS community and are now a requirement on some new Department of Defense (DoD) ATS programs. Different aspects of ATML related tools shall be discussed such as ATML Development tools which assist in the generation of ATML compliant instance files, new ATS related tools which use ATML data in their applications and the modification of existing ATS tools to utilize ATML Data. This paper also examines the work in progress of a Small Business Innovative Research (SBIR) Naval Air Systems Command (NAVAIR) sponsored program to develop ATML and test diagram tools. Utilizing ATML standards without the benefit of tools can be a labor-intensive, error-prone process, and requires an intimate knowledge of the ATML and XML standards. Employing the ATML standards on ATS programs promises to significantly reduce costs and schedule; the use of software tools are a key component in the success of these implementations and will help promote the use of ATML throughout the test industry.
{"title":"Software tools: A key component in the successful implementation of the ATML standards","authors":"Ron Taylor","doi":"10.1109/AUTEST.2011.6058788","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058788","url":null,"abstract":"This paper examines the IEEE Automatic Test Markup Language (ATML) family of standards and some of the impediments which must be overcome to successfully implement these standards. The paper specifically focuses on how software tools can help alleviate these issues and increase the benefits of using these new standards in Automatic Test System (ATS) related applications. The ATML standards provide a common exchange format for test data adhering to the Extensible Markup Language (XML) standard. ATML promises to provide interoperability between tools and multiple test platforms through the standardization of common test related data. The ATML standards have now been published through the IEEE Standards Coordinating Committee 20 (SCC20) committee and are beginning to exhibit considerable interest in the ATS community and are now a requirement on some new Department of Defense (DoD) ATS programs. Different aspects of ATML related tools shall be discussed such as ATML Development tools which assist in the generation of ATML compliant instance files, new ATS related tools which use ATML data in their applications and the modification of existing ATS tools to utilize ATML Data. This paper also examines the work in progress of a Small Business Innovative Research (SBIR) Naval Air Systems Command (NAVAIR) sponsored program to develop ATML and test diagram tools. Utilizing ATML standards without the benefit of tools can be a labor-intensive, error-prone process, and requires an intimate knowledge of the ATML and XML standards. Employing the ATML standards on ATS programs promises to significantly reduce costs and schedule; the use of software tools are a key component in the success of these implementations and will help promote the use of ATML throughout the test industry.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123787199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-24DOI: 10.1109/AUTEST.2011.6058790
C. Koepping, Paul J. Rajcok, Christopher Yoon
Information Assurance Vulnerability Alerts (IAVAs) have become an important part of protecting and securing our systems. Operating systems and their applications are all susceptible to bugs/problems that need to be fixed. Virus definitions, which are released daily, are another important piece of IAVA compliance. IAVA updates are released almost weekly to ensure the integrity of the operation systems and its applications. Systems that are already fielded need to be updated with these approved IAVA updates. These fielded systems aren't always connected to the World Wide Web, so obtaining updates on their own isn't a viable option. They are however, connected to approved servers. A service was needed to obtain these updates on a weekly basis with little user interaction. A user reboot of the system might be needed to ensure that the updates take effect. For the most part the update service is free from user interaction. The application could also be run manually at a fielded site if needed.
{"title":"Remote Automatic Test Equipment software management - Information Assurance Vulnerability Alert management","authors":"C. Koepping, Paul J. Rajcok, Christopher Yoon","doi":"10.1109/AUTEST.2011.6058790","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058790","url":null,"abstract":"Information Assurance Vulnerability Alerts (IAVAs) have become an important part of protecting and securing our systems. Operating systems and their applications are all susceptible to bugs/problems that need to be fixed. Virus definitions, which are released daily, are another important piece of IAVA compliance. IAVA updates are released almost weekly to ensure the integrity of the operation systems and its applications. Systems that are already fielded need to be updated with these approved IAVA updates. These fielded systems aren't always connected to the World Wide Web, so obtaining updates on their own isn't a viable option. They are however, connected to approved servers. A service was needed to obtain these updates on a weekly basis with little user interaction. A user reboot of the system might be needed to ensure that the updates take effect. For the most part the update service is free from user interaction. The application could also be run manually at a fielded site if needed.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116946478","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-24DOI: 10.1109/AUTEST.2011.6058732
D. Mishra, R. Gamad
This paper presents a new approach for determination of nonlinearity and Effective Number of Bits (ENOB) of an Analog to Digital Converter (ADC) for application input. Many times the input to ADC in an application is other than standard signals such as sine wave or triangular wave. Parameters of ADC determined using dynamic testing with standard signals are not useful if input signals are different. Different sinusoidal components of application input can be determined by spectrum analyzer. Application input can be generated by downloading data points created by computer in an Arbitrary Waveform Generator (AWG). Differential Nonlinearity (DNL) of an ADC is determined using deviation of actual histogram from reference or ideal histogram. Further estimation of Integral Nonlinearity (INL) is done from summation of DNL. ENOB is determined by estimating ideal rms error and actual rms error. These rms errors are computed by taking difference of sampled ADC input value available in computer and corresponding ADC output. Simulation results for 5 and 8 bit ADCs are reported and experimental results for an actual 8 bit ADC are also reported.. Comparison of simulation results by proposed method is done for standard sine wave, triangular wave and application inputs. It is expected that this work will initiate research toward ADC testing using application input.
{"title":"Dynamic testing of an ADC for real application input","authors":"D. Mishra, R. Gamad","doi":"10.1109/AUTEST.2011.6058732","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058732","url":null,"abstract":"This paper presents a new approach for determination of nonlinearity and Effective Number of Bits (ENOB) of an Analog to Digital Converter (ADC) for application input. Many times the input to ADC in an application is other than standard signals such as sine wave or triangular wave. Parameters of ADC determined using dynamic testing with standard signals are not useful if input signals are different. Different sinusoidal components of application input can be determined by spectrum analyzer. Application input can be generated by downloading data points created by computer in an Arbitrary Waveform Generator (AWG). Differential Nonlinearity (DNL) of an ADC is determined using deviation of actual histogram from reference or ideal histogram. Further estimation of Integral Nonlinearity (INL) is done from summation of DNL. ENOB is determined by estimating ideal rms error and actual rms error. These rms errors are computed by taking difference of sampled ADC input value available in computer and corresponding ADC output. Simulation results for 5 and 8 bit ADCs are reported and experimental results for an actual 8 bit ADC are also reported.. Comparison of simulation results by proposed method is done for standard sine wave, triangular wave and application inputs. It is expected that this work will initiate research toward ADC testing using application input.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121768542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-09-01DOI: 10.1109/AUTEST.2011.6058751
M. Lombardi
The concept of a test channel has long been a way of standardizing radio testing. The typical problem test engineers face is how to translate the final radio operating environment into a test plan. The typical approach would be to interpret the design parameters (assuming they were driven by the end user environment) and somehow derive tests to prove out a particular parameter. This is often accomplished through an assemblage of test equipment, each focusing on a specific operational parameter. This paper will discuss an approach that builds upon modern software-based Radio Frequency (RF) environment simulation tools in combination with a channel simulator in order to build the test channel. The advantages of this approach can be a flexible, reconfigurable test system that has clear traceability to the end user environment. This technique can be particularly advantageous when testing radios such as Software Defined Radios (SDRs) that support multiple modulation formats. Examples will highlight utilizing the same hardware for two different test channels; the first space-based, the second terrestrial.
{"title":"Building hardware-in-the-loop communication test channels","authors":"M. Lombardi","doi":"10.1109/AUTEST.2011.6058751","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058751","url":null,"abstract":"The concept of a test channel has long been a way of standardizing radio testing. The typical problem test engineers face is how to translate the final radio operating environment into a test plan. The typical approach would be to interpret the design parameters (assuming they were driven by the end user environment) and somehow derive tests to prove out a particular parameter. This is often accomplished through an assemblage of test equipment, each focusing on a specific operational parameter. This paper will discuss an approach that builds upon modern software-based Radio Frequency (RF) environment simulation tools in combination with a channel simulator in order to build the test channel. The advantages of this approach can be a flexible, reconfigurable test system that has clear traceability to the end user environment. This technique can be particularly advantageous when testing radios such as Software Defined Radios (SDRs) that support multiple modulation formats. Examples will highlight utilizing the same hardware for two different test channels; the first space-based, the second terrestrial.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121258746","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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