Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444523
A. Ivannikov, A. Stempkovskiy
Based on the analysis of the features of modern digital systems, the structure of a system for joint hardware/software simulation on functional-logic level are described. The purpose of the simulation is to debug a design of digital system before production. A hardware mathematical model is proposed, taking into account the peculiarities of modern digital systems, namely: the presence of bidirectional buses, high-impedance state of the outputs, internal memory of blocks. It is shown that the joint hardware/software simulation is reduced to solving systems of logical equations at each cycle of simulation.
{"title":"The Basics of Digital System Designs Simulation for Hardware/Software Joint Debugging","authors":"A. Ivannikov, A. Stempkovskiy","doi":"10.1109/SED51197.2021.9444523","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444523","url":null,"abstract":"Based on the analysis of the features of modern digital systems, the structure of a system for joint hardware/software simulation on functional-logic level are described. The purpose of the simulation is to debug a design of digital system before production. A hardware mathematical model is proposed, taking into account the peculiarities of modern digital systems, namely: the presence of bidirectional buses, high-impedance state of the outputs, internal memory of blocks. It is shown that the joint hardware/software simulation is reduced to solving systems of logical equations at each cycle of simulation.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130473297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444520
N. Grachev, A. Andryukhin, Victoria Chernoverskaya
The article discusses the characteristics of the total transient electrical resistance of the contact. The coefficients of the influence of the active and reactive components on the contact impedance are estimated. The dependences of the active and reactive components of the total electrical resistance of the contact on various factors are shown. The studies of the behavior of contact resistances of structural elements carried out in this work make it possible to predict the level of contact interference to radio reception in the future. This is due to the expansion of the spectrum of re-emitted electromagnetic radiation, which occurs due to the irradiation of structural elements with standard devices emitting electromagnetic waves.
{"title":"Investigation of the Characteristics of the Transient Electrical Resistance of Contacts in the Designs of Radio Electronic Devices in the Conditions of the Formation of Contact Radio Interference","authors":"N. Grachev, A. Andryukhin, Victoria Chernoverskaya","doi":"10.1109/SED51197.2021.9444520","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444520","url":null,"abstract":"The article discusses the characteristics of the total transient electrical resistance of the contact. The coefficients of the influence of the active and reactive components on the contact impedance are estimated. The dependences of the active and reactive components of the total electrical resistance of the contact on various factors are shown. The studies of the behavior of contact resistances of structural elements carried out in this work make it possible to predict the level of contact interference to radio reception in the future. This is due to the expansion of the spectrum of re-emitted electromagnetic radiation, which occurs due to the irradiation of structural elements with standard devices emitting electromagnetic waves.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122674521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444488
Islam Kunizhev, P. Korolev, I. Ivanov, K. Sedov
The research provides a review and analysis of the existing mathematical model of the pumping flashtubes operational failure rate. They are used in various spheres of human activity, such as: industry (laser welding, balancing devices), medicine (laser devices, endoscopes, blood analyzers), photography (high-speed cameras). A computational assessment was carried out using a decision support system, which makes it possible to numerically determine the importance of the factors considered in the work in assessing the operational failure rate. As a result of the study, the main parameters have been determined that have the greatest impact on the pumping flashtubes dependability. Mathematical models considering these parameters have been identified. Reliable mathematical model is proposed, suitable for evaluating the dependability characteristics of pulsed pump lamps.
{"title":"Research of Mathematical Models for Assessing the Pumping Flashtubes Failure Rate","authors":"Islam Kunizhev, P. Korolev, I. Ivanov, K. Sedov","doi":"10.1109/SED51197.2021.9444488","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444488","url":null,"abstract":"The research provides a review and analysis of the existing mathematical model of the pumping flashtubes operational failure rate. They are used in various spheres of human activity, such as: industry (laser welding, balancing devices), medicine (laser devices, endoscopes, blood analyzers), photography (high-speed cameras). A computational assessment was carried out using a decision support system, which makes it possible to numerically determine the importance of the factors considered in the work in assessing the operational failure rate. As a result of the study, the main parameters have been determined that have the greatest impact on the pumping flashtubes dependability. Mathematical models considering these parameters have been identified. Reliable mathematical model is proposed, suitable for evaluating the dependability characteristics of pulsed pump lamps.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"129 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124245679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444510
A. Chernodarov, A. Patrikeev
A two-stage calibration of inertial micro-electro-mechanical (MEMS) sensors is considered. In this paper, such sensors are gyroscopes and accelerometers, oriented along three orthogonal axes and placed in a single inertial measurement module. The first stage of calibration is carried out in the factory at the bench without linear overloads. The second stage is implemented in a dynamic mode in a mobile laboratory that provides linear overloads. At this stage, the drifts of the sensor signals are estimated, as well as the skews of their measuring axes, which remained after the factory calibration. In addition, structural and parametric identification of dynamic models of sensor signal drifts is performed. Such models are used to compensate for the errors of MEMS sensors in autonomous inertial navigation modes, including the loss of satellite signals. The errors of MEMS sensors in motion are estimated using information from the reference inertial satellite navigation system and the extended Kalman filter. The results of full-scale experiments are analyzed.
{"title":"In-Motion Calibration and Testing of MEMS Sensors Using a Reference Inertial Satellite Navigation System","authors":"A. Chernodarov, A. Patrikeev","doi":"10.1109/SED51197.2021.9444510","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444510","url":null,"abstract":"A two-stage calibration of inertial micro-electro-mechanical (MEMS) sensors is considered. In this paper, such sensors are gyroscopes and accelerometers, oriented along three orthogonal axes and placed in a single inertial measurement module. The first stage of calibration is carried out in the factory at the bench without linear overloads. The second stage is implemented in a dynamic mode in a mobile laboratory that provides linear overloads. At this stage, the drifts of the sensor signals are estimated, as well as the skews of their measuring axes, which remained after the factory calibration. In addition, structural and parametric identification of dynamic models of sensor signal drifts is performed. Such models are used to compensate for the errors of MEMS sensors in autonomous inertial navigation modes, including the loss of satellite signals. The errors of MEMS sensors in motion are estimated using information from the reference inertial satellite navigation system and the extended Kalman filter. The results of full-scale experiments are analyzed.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126804279","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444538
Ye Ko Ko Aung, S. Timoshenkov, B. M. Simonov, Andrey C. Riabyshenkov
Modern designs of sensitive elements of many MEMS, including micromechanical accelerometers, contain suspension elements, with the help of which the inertial mass is connected to a fixed frame. The simulation was carried out using the ANSYS program, the parameters and characteristics of the sensitive element of a micromechanical accelerometer with suspension elements of various designs made of silicon with different crystallographic orientations were investigated, and the values of their most important parameters were obtained. The natural frequencies of oscillations of the inertial mass, the residual mechanical stress in the structural elements of the sensitive element of the micromechanical accelerometer were calculated. Changes in the natural vibration frequency and residual mechanical stress in the suspension elements were determined when the temperature changed from +150 to –150 ° C in a short time interval (10 s). The change in the residual mechanical stress of the inertial mass of the sensitive element during impact was investigated. The results obtained made it possible to develop recommendations for choosing the design of a sensitive element with silicon suspension elements, which provide high sensitivity and stability of the parameters of a micromechanical accelerometer. The results obtained will be useful in the development of real designs of MEMS sensitive elements with optimal and stable parameters.
{"title":"Analysis of the Suspension Elements for the Sensitive Element of a Micromechanical Accelerometer","authors":"Ye Ko Ko Aung, S. Timoshenkov, B. M. Simonov, Andrey C. Riabyshenkov","doi":"10.1109/SED51197.2021.9444538","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444538","url":null,"abstract":"Modern designs of sensitive elements of many MEMS, including micromechanical accelerometers, contain suspension elements, with the help of which the inertial mass is connected to a fixed frame. The simulation was carried out using the ANSYS program, the parameters and characteristics of the sensitive element of a micromechanical accelerometer with suspension elements of various designs made of silicon with different crystallographic orientations were investigated, and the values of their most important parameters were obtained. The natural frequencies of oscillations of the inertial mass, the residual mechanical stress in the structural elements of the sensitive element of the micromechanical accelerometer were calculated. Changes in the natural vibration frequency and residual mechanical stress in the suspension elements were determined when the temperature changed from +150 to –150 ° C in a short time interval (10 s). The change in the residual mechanical stress of the inertial mass of the sensitive element during impact was investigated. The results obtained made it possible to develop recommendations for choosing the design of a sensitive element with silicon suspension elements, which provide high sensitivity and stability of the parameters of a micromechanical accelerometer. The results obtained will be useful in the development of real designs of MEMS sensitive elements with optimal and stable parameters.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122938039","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444496
V. Danilchenko, Yevgenia Vladimirovna Danilchenko, V. Kureichik
The article describes the solution to the problem of placing elements in blocks on a crystal model based on a genetic algorithm (GA), which allows creating an algorithmic environment in the field of genetic search for solving the problem of placing elements on a crystal, taking into account the criterion for the maximum number of linear segments. The purpose of this work is to find ways of placing elements in blocks based on a genetic algorithm. The scientific novelty lies in the development of a modified genetic algorithm for computer-aided design of very large-scale integrated circuits, taking into account the criterion for the maximum number of line segments. The problem statement in this work is as follows: to optimize the placement of elements in blocks by using a modified GA taking into account the criterion for the maximum number of line segments. A fundamental difference from the known approaches in the use of new modified genetic structures in computer-aided design, in addition, the paper presents a new method for placing elements on a crystal, based on a modified GA, taking into account the criterion for the maximum number of linear segments. Thus, the problem of creating methods, algorithms and software for automated placement of elements on a chip is currently of particular relevance.
{"title":"Genetic Algorithms in the Matrix Arrangement of Elements in Blocks on a Crystal Model","authors":"V. Danilchenko, Yevgenia Vladimirovna Danilchenko, V. Kureichik","doi":"10.1109/SED51197.2021.9444496","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444496","url":null,"abstract":"The article describes the solution to the problem of placing elements in blocks on a crystal model based on a genetic algorithm (GA), which allows creating an algorithmic environment in the field of genetic search for solving the problem of placing elements on a crystal, taking into account the criterion for the maximum number of linear segments. The purpose of this work is to find ways of placing elements in blocks based on a genetic algorithm. The scientific novelty lies in the development of a modified genetic algorithm for computer-aided design of very large-scale integrated circuits, taking into account the criterion for the maximum number of line segments. The problem statement in this work is as follows: to optimize the placement of elements in blocks by using a modified GA taking into account the criterion for the maximum number of line segments. A fundamental difference from the known approaches in the use of new modified genetic structures in computer-aided design, in addition, the paper presents a new method for placing elements on a crystal, based on a modified GA, taking into account the criterion for the maximum number of linear segments. Thus, the problem of creating methods, algorithms and software for automated placement of elements on a chip is currently of particular relevance.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130288128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444537
F. Ismagilov, V. Vavilov, A. Zherebtsov, I. Sayakhov, E. Zharkov, G. Zinnatullina
The purpose of this article is to provide an increase in the efficiency of a starter generator (STG) with a reduced supply voltage of 27 V by modifying the phase switching control method. In this article, a comparison of two methods of phase switching, traditional and with a modified angle, was presented, as a result of which the difference and prospects, as well as the effectiveness of the chosen solution, were clearly shown. Thermal calculations were also performed, which confirmed that the temperature values of the active elements of the starter generator did not exceed the permissible values for the materials used in all operating modes.
{"title":"Modified Method for Controlling the Switching of the Starter-Generator Phases","authors":"F. Ismagilov, V. Vavilov, A. Zherebtsov, I. Sayakhov, E. Zharkov, G. Zinnatullina","doi":"10.1109/SED51197.2021.9444537","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444537","url":null,"abstract":"The purpose of this article is to provide an increase in the efficiency of a starter generator (STG) with a reduced supply voltage of 27 V by modifying the phase switching control method. In this article, a comparison of two methods of phase switching, traditional and with a modified angle, was presented, as a result of which the difference and prospects, as well as the effectiveness of the chosen solution, were clearly shown. Thermal calculations were also performed, which confirmed that the temperature values of the active elements of the starter generator did not exceed the permissible values for the materials used in all operating modes.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117223032","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444498
V. Martynov, T. Didyk, N. Zvereva, Julia Sharonova
The technology of current electrical engineering enterprise ‘s architecture modeling is studied in a form which is convenient for analyzing the architecture’s state and determining its break with the target architecture which must be possessed by the enterprise during transformation into Industry 4.0. Instruments that are necessary for enterprise architecture designing and analyzing are still in status of development. Analyzing of current enterprise architecture demands methods of complex description of its layers and single elements. In this context enterprise architecture includes following: enterprise business architecture, application, data architecture, and technical system architecture. Aiming to find the best architectural solution, limits of resources, which will be available for building the enterprise architecture, as well as a set of metrics for evaluating and comparing project decisions, must be identified at each level. At the business architecture level, the business processes parameters and their relationship with other elements of this layer - organizational structure, management models, conceptual data model, as well as with elements of other layers of architecture are being analyzed. The applied methodologies will make it possible to objectify and concretize the concepts of enterprise architecture building, which will allow us to formulate a set of functional requirements for the software module for the analysis and evaluation of the optimal architecture. ArchiMate language allows to model an architecture in the most full and comprehensive way. An approach to the search for the optimal architectural solution based on significant criterion, which affects the architecture of the enterprise as a whole, is suggested. The proposed it contributes to the effective achievement of the goals of the enterprise within the framework of the adopted strategies. The set of enterprise business architecture has been developed with the use of the ArchiMate language. This approach is applicable to modeling the architecture of an electrical engeneeting enterprise, which provides support for modern technologies as the basis for its transformation into Industry 4.0.
{"title":"Electrical Engineering Enterprise's Architecture Modeling as a Basis for its Transformation into Industry 4.0","authors":"V. Martynov, T. Didyk, N. Zvereva, Julia Sharonova","doi":"10.1109/SED51197.2021.9444498","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444498","url":null,"abstract":"The technology of current electrical engineering enterprise ‘s architecture modeling is studied in a form which is convenient for analyzing the architecture’s state and determining its break with the target architecture which must be possessed by the enterprise during transformation into Industry 4.0. Instruments that are necessary for enterprise architecture designing and analyzing are still in status of development. Analyzing of current enterprise architecture demands methods of complex description of its layers and single elements. In this context enterprise architecture includes following: enterprise business architecture, application, data architecture, and technical system architecture. Aiming to find the best architectural solution, limits of resources, which will be available for building the enterprise architecture, as well as a set of metrics for evaluating and comparing project decisions, must be identified at each level. At the business architecture level, the business processes parameters and their relationship with other elements of this layer - organizational structure, management models, conceptual data model, as well as with elements of other layers of architecture are being analyzed. The applied methodologies will make it possible to objectify and concretize the concepts of enterprise architecture building, which will allow us to formulate a set of functional requirements for the software module for the analysis and evaluation of the optimal architecture. ArchiMate language allows to model an architecture in the most full and comprehensive way. An approach to the search for the optimal architectural solution based on significant criterion, which affects the architecture of the enterprise as a whole, is suggested. The proposed it contributes to the effective achievement of the goals of the enterprise within the framework of the adopted strategies. The set of enterprise business architecture has been developed with the use of the ArchiMate language. This approach is applicable to modeling the architecture of an electrical engeneeting enterprise, which provides support for modern technologies as the basis for its transformation into Industry 4.0.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116332596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444490
D. Denisenko, N. Prokopenko, N. Butyrlagin
A new circuit of a fourth-order band-pass RC-filter (BPF) which provides independent adjustment of the main parameters is investigated: the irregularity of frequency characteristic (FC), the bandwidth and the scale transfer coefficient. An algorithm for choosing the circuit parameters to achieve a given accuracy of digital potentiometers is described. The transfer functions of the developed BPF are presented and the frequency response obtained as a result of computer simulation in CAD Micro-Cap is shown.
{"title":"Active Fourth-Order Band-Pass RC-filter with Independent Control of Bandwidth and Irregularity of Frequency Response","authors":"D. Denisenko, N. Prokopenko, N. Butyrlagin","doi":"10.1109/SED51197.2021.9444490","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444490","url":null,"abstract":"A new circuit of a fourth-order band-pass RC-filter (BPF) which provides independent adjustment of the main parameters is investigated: the irregularity of frequency characteristic (FC), the bandwidth and the scale transfer coefficient. An algorithm for choosing the circuit parameters to achieve a given accuracy of digital potentiometers is described. The transfer functions of the developed BPF are presented and the frequency response obtained as a result of computer simulation in CAD Micro-Cap is shown.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121579398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-04-27DOI: 10.1109/SED51197.2021.9444524
V. Emelyanov, T. Dobrovolskaya, V. Emelyanov
The presented research is aimed at developing scientific and technical bases for conducting mathematical modeling of nanostructured physical objects of small dimensions. The sensitivity of identification of biologically active nanoparticles of metallic gold to cancer cells is considered based on the results of differentiation of the equivalent radii of intersection of ellipses of the distribution of statistical values of the peaks of Raman spectra together with the XY equations. A method is proposed for the automatic solution of a multidimensional system of nonlinear differential equations for the intersection of ellipsoids of Raman spectrograms of dielectric materials with and without gold nanoparticles. When solving the problem of increasing the accuracy and speed of recognition of gold nanoparticles on the surface of the fibers, the polarization of laser radiation along and across the fibers was taken into account. When solving the system using nonlinear quadratic and XY differential equations of the equivalent radii of the ellipses of the distribution, a high accuracy of R0 and R1 is obtained up to 10-15.
{"title":"Automatic Solution of the System of Equations of the Equivalent Radius of the Distribution Ellipses of Dielectric Materials for the Recognition of Gold Nanoparticles","authors":"V. Emelyanov, T. Dobrovolskaya, V. Emelyanov","doi":"10.1109/SED51197.2021.9444524","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444524","url":null,"abstract":"The presented research is aimed at developing scientific and technical bases for conducting mathematical modeling of nanostructured physical objects of small dimensions. The sensitivity of identification of biologically active nanoparticles of metallic gold to cancer cells is considered based on the results of differentiation of the equivalent radii of intersection of ellipses of the distribution of statistical values of the peaks of Raman spectra together with the XY equations. A method is proposed for the automatic solution of a multidimensional system of nonlinear differential equations for the intersection of ellipsoids of Raman spectrograms of dielectric materials with and without gold nanoparticles. When solving the problem of increasing the accuracy and speed of recognition of gold nanoparticles on the surface of the fibers, the polarization of laser radiation along and across the fibers was taken into account. When solving the system using nonlinear quadratic and XY differential equations of the equivalent radii of the ellipses of the distribution, a high accuracy of R0 and R1 is obtained up to 10-15.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133727065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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